Advanced Thermal Measurement Techniques

1. Name of the event: Advanced Thermal Measurement Techniques
2. Type of the event: intensive course
3. Number of hours or days: 2 days
4. Planned dates: June 20-21, 2005
5. Frequency: one-time event
6. Venue: Technical University of Lodz, Lodz, Poland
7. Target audience: university teaching staff, PhD. students, university students, engineers from the industry
8. Prerequisites (expected knowledge and experience of participants): basic knowledge on heat transfer
9. Character of the event: International, open
10. Expected fee: Free of charge for REASON partners, for others 10 EURO
11. Are travel grants available ? No
12. Language of the event: English
13. Number of participants: maximum 8. Priority for REASON partners.
14. Brief description of the programme of the event:

Modern techniques allow to perform fast, accurate and non-invasive thermal measurements. In particular, measurements performed using thermographic cameras can be extremely useful, as they at once give information about temperature distribution in a large area. However, performing correct measurements is not an easy task, there mare many factors that influence the process and can spoil measurement results. The course will show both the advantages coming from the application of modern thermal measurement techniques and the ways to guard against measurement errors.

The course will consist of 8 hours of lectures explaining the participants the theory and techniques of thermal measurements and 8 hours of laboratory giving the opportunity to apply the acquired knowledge in practice.

Notice: Please note that the number of participants is limited to 8. The REASON participants will have the priority if the number of requests exceeds the maximum number of course participants.

Contents:
Day 1. (June 20th)
Thermal measurements – theory and modern techniques.

9.00 – 13.00 Lectures I.
1.    Current thermal measurement techniques – advantages, disadvantages and suitability for different applications.
2.    Thermographic measurements:
2.1.    Principles of thermographic measurements:
2.1.1.    Basics of heat transfer.
2.1.2.    Infrared measurements in theory.
2.1.3.    Types and construction of radiation sensors and thermographic cameras.
2.1.4.    Typical fields of application.
3.    Performing correct thermographic measurements:
3.1.    Preparation of the object of examination.
3.2.    Preventing measurement errors.

13.00 – 14.30 Lunch break.

14.30 – 18.30 Lectures II.
4.    Postprocessing of the thermograms:
4.1.    Emissivity correction.
4.2.    Extracting information.
5.    P-N junction as a temperature sensor:
5.1.    Principles.
5.2.    Fields of application.


Day 2. (June 21st)
Thermal measurements – practical exercises.

9.00 – 13.00 Laboratory I.
1.    Thermographic measurements:
1.1.    Introduction to the Inframetrics SC1000 thermographic camera and additional equipment.
1.2.    Illustration of possible measurement errors:
1.2.1.    Influence of emissivity factor.
1.2.2.    Problems with reflections.
1.2.3.    Effects of limited spatial resolution.
1.2.4.    Results of measurement noise.
2.    Calculation of an RC thermal model parameters.

13.00 – 14.30 Lunch break.

14.30 – 18.30 Laboratory II.
3.    P-N junction measurements:
3.1.    Measurements of a sample integrated circuit.
3.2.    Comparison with thermographic measurements results.
3.3.    Calculation of thermal resistance.
4.    Using the postprocessing programs.

Download general information and course program as PDF file

Accommodation: Katarzyna Bieniek

General information: Wojciech Tylman

Last updated: April 14, 2005